Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits-Reference-Cited by-同舟云学术

Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits

Published:2008-12 Issue:12 Volume:39 Page:1728-1735
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Alaeldine Ali,Lacrampe Nicolas,Boyer Alexandre,Perdriau Richard,Caignet Fabrice,Ramdani Mohamed,Sicard Etienne,Drissi M’hamed

Publisher

Elsevier BV

Subject

General Engineering

Reference26 articles.

1. IEC EMC Task Force, IEC61967-4: integrated circuits, measurement of electromagnetic emissions, 150kHz to 1GHz—part 4: measurement of conducted emissions—1Ω/150Ω direct coupling method, Technical Report, IEC, July 2006.

2. IEC EMC Task Force, IEC62132-5: measurement of electromagnetic immunity 150kHz to 1GHz—part 5: workbench Faraday cage method, Technical Report, IEC, October 2005.

3. IEC EMC Task Force, IEC61967-5: integrated circuits, measurement of electromagnetic emissions, 150kHz to 1GHz—part 5: workbench Faraday cage method, Technical Report, IEC, February 2003.

4. IEC EMC Task Force, IEC62132-3: measurement of electromagnetic immunity 150kHz to 1GHz—part 3: bulk current injection (BCI) method, Draft Technical Report, IEC, December 2007.

5. IEC EMC Task Force, IEC62132-4: measurement of electromagnetic immunity 150kHz to 1GHz—part 4: direct RF power injection method, Draft Technical Report, IEC, September 2007.

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