A compact C–V model for 120nm AlGaN/GaN HEMT with modified field dependent mobility for high frequency applications

Author:

Gangwani Parvesh,Pandey Sujata,Haldar Subhasis,Gupta Mridula,Gupta R.S.

Publisher

Elsevier BV

Subject

General Engineering

Reference21 articles.

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2. GaN Processing, defects and devices;Pearson;J. Appl. Phys.,1999

3. Field effect transistor structure based on strain induced polarization charges;Kuech;J. Appl. Phys.,1990

4. Elastic strain relaxation and piezoeffect in GaN–AlN, GaN–AlGaN and GaN–InGaN superlattices;Bykhovski;J. Appl. Phys.,1997

5. Low-loss high power RF switching using multiFinger AlGaN/GaN MOSFETS;Koudymov;IEEE Electron Device Lett.,2002

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1. Analytical Modeling and Simulation-Based Investigation of AlGaN/AlN/GaN Bio-HEMT Sensor for C-erbB-2 Detection;IEEE Sensors Journal;2018-12-01

2. Effect of Surface Passivation on the Electrical Characteristics of Nanoscale AlGaN/GaN HEMT;IOP Conference Series: Materials Science and Engineering;2017-08

3. A DC analytical AlGaN/GaN HEMT model for transistor characterisation;2016 21st International Conference on Microwave, Radar and Wireless Communications (MIKON);2016-05

4. The Study of Self-Heating and Hot-Electron Effects for AlGaN/GaN Double-Channel HEMTs;IEEE Transactions on Electron Devices;2012-05

5. DC and RF performance of an In0.1Ga0.9N/InN high electron mobility transistor;physica status solidi (c);2011-06-07

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