1. Review on the Reliability Mechanisms of SiC Power MOSFETs: A Comparison Between Planar-Gate and Trench-Gate Structures
2. IEEE Trans. Electron Devices. 64 674;Williams,2017
3. International Symposium on Power Semiconductor Devices and ICs;Spaziani,2018
4. Control of electric field in 4H-SiC UMOSFET: Physical investigation
5. 2005 International Symposium on Power Semiconductor Devices and ICs;Zhang,2005