Author:
Jaber Houssein,Monteiro Fabrice,Piestrak StanisŁaw J.,Dandache Abbas
Reference36 articles.
1. Single event upset at ground level;Normand;IEEE Trans. Nucl. Sci.,1996
2. Sun flips bits in chips;Larner;Electron. Times,1997
3. Terrestrial cosmic rays intensities;Ziegler;IBM J. Res. Dev.,1998
4. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Device Mater. Reliab.,2005
5. Error detecting and error correcting codes;Hamming;Bell Syst. Tech. J.,1950
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