Author:
Sedaghat Reza,Javaheri Reza,Kalkat Prabhleen K.,Mohammad Chikhe Jalal
Reference37 articles.
1. R. C. Baumann, Single event effects in advanced CMOS Technology, in: Proc. IEEE Nucl. Space Radiat. Eff. Conf. Short Course Text, 2005.
2. SEU characterization and design dependence of the SA3300 microprocessor;Sexton;IEEE Trans. Nucl. Sci.,1990
3. An SEU-hardened CMOS data latch design;Rockett;IEEE Trans. Nucl. Sci.,1988
4. Low power SEU immune CMOS memory circuits,;Liu;IEEE Trans. Nucl. Sci.,1992
5. Upset hardened memory design for submicron CMOS technology;Calin;IEEE Trans. Nucl. Sci.,1996