1. On the importance of checking cryptographic protocols for faults (extended abstract);Boneh,1997
2. Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits;Rodrigo;Microelectron. J.,2018
3. Differential fault analysis of secret key cryptosystems;Biham,1997
4. Experimental validation of a bulk built-in current sensor for detecting laser-induced currents;Clement,2015
5. Renesas Technology Corporation. Ic Card System Using Photo-Detectors for Protection, 2003. US Patent US7042752.