Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications-Reference-Cited by-同舟云学术

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Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications

Published:2023 Issue: Volume:11 Page:136269-136278
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Zooker David¹^ORCID,Weizman Yoav¹,Fish Alexander¹^ORCID,Keren Osnat¹^ORCID

Affiliation:

1. Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel

Funder

Israel Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/6287639/10005208/10335669.pdf?arnumber=10335669

Reference40 articles.

1. On the Importance of Checking Cryptographic Protocols for Faults

2. How Practical Are Fault Injection Attacks, Really?

3. Fault Injection Attacks on Cryptographic Devices: Theory, Practice, and Countermeasures

4. Application of Optical Techniques to Hardware Assurance

5. Hardware Designer's Guide to Fault Attacks

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