Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation-Reference-Cited by-同舟云学术

Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation

Published:2019-08 Issue: Volume:90 Page:29-38
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Garg Achiranshu,Lee Zhao Chuan,Lu Lu,Kim Tony Tae-Hyoung

Publisher

Elsevier BV

Subject

General Engineering

Reference25 articles.

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