Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern-Reference-Cited by-同舟云学术

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Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern

Published:2023-08 Issue: Volume:138 Page:105841
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Zhang Hong,Liang Huaguo,Hu Jiewen,Shao Zhiwei,Yi Maoxiang,Lu Yingchun,Huang Zhengfeng

Funder

National Natural Science Foundation of China

National Key Scientific Instrument and Equipment Development Projects of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. Multi-Transition Fault Model (MTFM) ATPG patterns towards achieving 0 DPPB on automotive designs;Corso,2021

2. Challenges in cell-aware test;Dixit,2018

3. SAT-ATPG generated multi-pattern scan tests for cell internal defects: coverage analysis for resistive opens and shorts;Pandey,2020

4. Tightening the mesh size of the cell-aware ATPG net for catching all detectable weakest faults;Hu,2020

5. Process defect trends and strategic test gaps;Ryan,2014

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multi-transition delay test for improving the coverage of cell internal defects;IEICE Electronics Express;2024-08-10

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