Author:
Kozisek J.,Machacek Z.,Benda V.
Reference16 articles.
1. Statistics of recombination of holes and electrons;Shockley;Phys. Rev.,1952
2. Auger-Rekombination im Mittelgebiet Durchlassbelaster Silizium-Gleichleiter und Thyristoren;Krausse;Solid State Electron.,1974
3. Diffusion in Silicon, Semiconductor Silicon;Kendall,1971
4. Gettering Phenomena in Silicon, Semiconductor Silicon;Gilles,1994
5. Imperfections and Impurities in Semiconductor Silicon;Ravi,1981