Xenon migration in UO2 under irradiation studied by SIMS profilometry-Reference-Cited by-同舟云学术

Xenon migration in UO2 under irradiation studied by SIMS profilometry

Published:2013-09 Issue:1-3 Volume:440 Page:562-567
ISSN:0022-3115
Container-title:Journal of Nuclear Materials
language:en
Short-container-title:Journal of Nuclear Materials

Author:

Marchand B.,Moncoffre N.,Pipon Y.,Bérerd N.,Garnier C.,Raimbault L.,Sainsot P.,Epicier T.,Delafoy C.,Fraczkiewicz M.,Gaillard C.,Toulhoat N.,Perrat-Mabilon A.,Peaucelle C.

Publisher

Elsevier BV

Subject

Nuclear Energy and Engineering,General Materials Science,Nuclear and High Energy Physics

Reference28 articles.

1. An electron microscope examination of matrix fission-gas bubbles in irradiated uranium dioxide

2. Effect of stoichiometry on diffusion of xenon in UO2

3. Inert gas release from metals and UO2 during high temperature annealing: the role of thermal vacancies

4. Temperature dependence of diffusivity of xenon in high dose irradiated UO2

5. Xenon-133 diffusion and trapping in single-crystal uranium dioxide

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