Interface characterization and current conduction in HfO2-gated MOS capacitors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Interface characterization and current conduction in HfO2-gated MOS capacitors

Published:2008-07 Issue:19 Volume:254 Page:6112-6115
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Chen H.W.,Chiu F.C.,Liu C.H.,Chen S.Y.,Huang H.S.,Juan P.C.,Hwang H.L.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference27 articles.

1. Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's

2. Low leakage, ultra-thin gate oxides for extremely high performance sub-100 nm nMOSFETs

Cited by 30 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 2D Amorphous GaO_X Gate Dielectric for β-Ga₂O₃ Field-Effect Transistors;ACS Applied Materials & Interfaces;2023-07-27

2. Electronic excitation-induced tunneling and charge-trapping explored by in situ electrical characterization in Ni/HfO2/β-Ga2O3 metal–oxide–semiconductor capacitors;Materials Science and Engineering: B;2022-07

3. Field cycling behavior and breakdown mechanism of ferroelectric Al_0.78Sc_0.22N films;Japanese Journal of Applied Physics;2022-06-10

4. Assessment of the Morphological, Optical, and Photoluminescence Properties of HfO₂ Nanoparticles Synthesized by a Sol–Gel Method Assisted by Microwave Irradiation;Inorganic Chemistry;2022-04-19

5. Interfacial Characterization and Transport Conduction Mechanisms in Al|HfO2|p-Ge Structures: Energy Band Diagram;Semiconductors;2020-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3