Environmental stability and ageing of ScN thin films from XPS Ar+ depth profiling-Reference-Cited by-同舟云学术

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Environmental stability and ageing of ScN thin films from XPS Ar+ depth profiling

Published:2024-11 Issue: Volume:674 Page:160867
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Cichoň Stanislav,More-Chevalier Joris,Wdowik Urszula D.,de Prado Esther,Bulíř Jiří,Novotný Michal,Fekete Ladislav,Duchoň Jan,Legut Dominik,Lančok Ján

Publisher

Elsevier BV

Reference64 articles.

1. Thermoelectric properties of epitaxial ScN films deposited by reactive magnetron sputtering onto MgO(001) substrates;Burmistrova;J. Appl. Phys.,2013

2. Anomalously high thermoelectric power factor in epitaxial ScN thin films;Kerdsongpanya;Appl. Phys. Lett.,2011

3. Thermoelectric properties of HfN/ScN metal/semiconductor superlattices: a first-principles study;Saha;J. Phys. Condens. Matter,2012

4. Valence and conduction band alignment at ScN interfaces with 3C-SiC (111) and 2H-GaN (0001);King;Appl. Phys. Lett.,2014

5. Growth of poly- and single-crystal ScN on MgO(001): Role of low-energy N2+ irradiation in determining texture, microstructure evolution, and mechanical properties;Gall;J. Appl. Phys.,1998

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