Methodological development of topographic correction in 2D/3D ToF-SIMS images using AFM images-Reference-Cited by-同舟云学术

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Methodological development of topographic correction in 2D/3D ToF-SIMS images using AFM images

Published:2018-02 Issue: Volume:432 Page:90-96
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Jung Seokwon,Lee Nodo,Choi Myungshin,Lee Jungmin,Cho Eunkyunng,Joo Minho

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference11 articles.

1. Comparison of SIMS and MALDI for Mass Spectrometric Imaging BT—Imaging Mass Spectrometry: Protocols for Mass Microscopy;Hammond,2010

2. Imaging mass spectrometry;McDonnell;Mass Spectrom. Rev.,2017

3. Topography in secondary ion mass spectroscopy images;Rangarajan;J. Vac. Sci. Technol. A,2006

4. Analysis of organic multilayers and 3D structures using Ar cluster ions;Niehuis;Surf. Interface Anal.,2013

5. ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: effect of nanostructure on device efficiency;Yu;Analyst,2011

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