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Phase formation by ion beam mixing in the Ti/Si multilayer system

  • Published:2006-03 Issue:11 Volume:252 Page:4016-4019
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Sisodia Veenu,Kabiraj D.,Bolse W.,Jain I.P.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ZrSi formation at ZrN/Si interface induced by ballistic and ionizing radiations;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-09

2. Study of focused-ion-beam–induced structural and compositional modifications in nanoscale bilayer systems by combined grazing incidence x ray reflectivity and fluorescence;Journal of Applied Physics;2012-02-15

3. Ion beam induced surface and interface engineering;Surface Science Reports;2011-03

4. Engineering of Materials by Swift Heavy Ion Beam Mixing;Swift Heavy Ions for Materials Engineering and Nanostructuring;2011

5. Interfaces evolution in Ti/Si multilayers obtained by laser ablation;16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics;2008-12-12
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