Impact of surface roughness on tracer depth profiling and its implications for <mml:math altimg="si7.gif" overflow="scroll" xmlns:xocs="http://www.elsevier.com/xml/xocs/dtd" xmlns:xs="http://www.w3.org/2001/XMLSchema" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.elsevier.com/xml/ja/dtd" xmlns:ja="http://www.elsevier.com/xml/ja/dtd" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:tb="http://www.elsevier.com/xml/common/table/dtd" xmlns:sb="http://www.elsevier.com/xml/common/struct-bib/dtd" xmlns:ce="http://www.elsevier.com/xml/common/dtd" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:cals="http://www.elsevier.com/xml/common/cals/dtd" xmlns:sa="http://www.elsevier.com/xml/common/struct-aff/dtd"><mml:mmultiscripts><mml:mi mathvariant="normal">Cd</mml:mi><mml:mprescripts/><mml:none/><mml:mn>109</mml:mn></mml:mmultiscripts></mml:math> and <mml:math altimg="si8.gif" overflow="scroll" xmlns:xocs="http://www.elsevier.com/xml/xocs/dtd" xmlns:xs="http://www.w3.org/2001/XMLSchema" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.elsevier.com/xml/ja/dtd" xmlns:ja="http://www.elsevier.com/xml/ja/dtd" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:tb="http://www.elsevier.com/xml/common/table/dtd" xmlns:sb="http://www.elsevier.com/xml/common/struct-bib/dtd" xmlns:ce="http://www.elsevier.com/xml/common/dtd" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:cals="http://www.elsevier.com/xml/common/cals/dtd" xmlns:sa="http://www.elsevier.com/xml/common/struct-aff/dtd"><mml:mmultiscripts><mml:mi mathvariant="normal">Zn</mml:mi><mml:mprescripts/><mml:none/><mml:mn>65</mml:mn></mml:mmultiscripts></mml:math> diffusion experiments in solar-grade Cu(In,Ga)Se2 layers-Reference-Cited by-同舟云学术

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Impact of surface roughness on tracer depth profiling and its implications for Cd109 and Zn65 diffusion experiments in solar-grade Cu(In,Ga)Se2 layers

Published:2014-07 Issue: Volume:307 Page:428-437
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Eschen T.,Hiepko K.,Bastek J.,Stolwijk N.A.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference16 articles.

1. Diffusion in Solids;Mehrer,2007

2. Fe diffusion in polycrystalline Cu(In,Ga)Se2 layers for thin-film solar cells

3. Diffusion and incorporation of Cd in solar-grade Cu(In,Ga)Se2 layers

4. Zinc diffusion in polycrystalline Cu(In,Ga)Se2 and single-crystal CuInSe2 layers

5. Proc. 22th Eur. Photovolt. Solar Energy Conf., Vol. II;Voorwinden,2007

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Chemical diffusion of copper in lead telluride;Solid State Ionics;2017-05

2. Dissociative diffusion mechanism in vacancy-rich materials according to mass action kinetics;AIP Advances;2016-05

3. Measurement of surface roughness of plasma-deposited films using laser speckles;Applied Surface Science;2015-12

4. Experimental Evidence of Multiple Diffusion Mechanisms in Thin-Film Cu(In,Ga)Se2;IEEE Journal of Photovoltaics;2015-09

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