The peculiarities of structural and optical properties of HfO2-based films co-doped with silicon and erbium-Reference-Cited by-同舟云学术

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The peculiarities of structural and optical properties of HfO2-based films co-doped with silicon and erbium

Published:2019-03 Issue: Volume:471 Page:521-527
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Khomenkova Larysa,Korsunska Nadiia,Labbé Christophe,Portier Xavier,Gourbilleau Fabrice

Funder

National Academy of Sciences of Ukraine

Ministry of Education and Science

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference47 articles.

1. Third Generation Photovoltaics: Advanced Solar Energy Conversion;Green,2003

2. Enhancing the performance of silicon solar cells via the application of passive luminescence conversion layers;Richards;Sol. Energy Mater. Sol. Cells,2006

3. Modifying the solar spectrum to enhance silicon solar cell efficiency—an overview of available materials;Strumpel;Sol. Energy Mater. Sol. Cells,2007

4. Luminescent layers for enhanced silicon solar cell performance: down-conversion;Richards;Sol. Energy Mater. Sol. Cells,2006

5. Improving solar cell efficiencies by down-conversion of high-energy photons;Trupke;J. Appl. Phys.,2002

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1. Comprehensive investigation of Er2O3 thin films grown with different ALD approaches;Surfaces and Interfaces;2022-11

2. Sensitized electroluminescence from erbium doped silicon rich oxynitride light emitting devices;Journal of Luminescence;2021-07

3. Correlation of luminescence measurements to the structural characterization of Pr3+-doped HfSiOx;Journal of Luminescence;2021-07

4. Optical, structural and electrical characterization of pure ZnO films grown on p-type Si substrates by radiofrequency magnetron sputtering in different atmospheres;Semiconductor Science and Technology;2020-08-18

5. Effect of plasmon–phonon interaction on the infrared reflection spectra of MgxZn1-xO/Al2O3 structures;Journal of Materials Science: Materials in Electronics;2020-02-28

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