Characterizing interface structure between crystalline and ion bombarded silicon by transmission electron microscopy and molecular dynamics simulations-Reference-Cited by-同舟云学术

Characterizing interface structure between crystalline and ion bombarded silicon by transmission electron microscopy and molecular dynamics simulations

Published:2021-02 Issue: Volume:540 Page:148278
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Rumyantsev Alexander V.,Borgardt Nikolay I.,Prikhodko Alexander S.,Chaplygin Yuri A.

Funder

Ministry of Science and Higher Education of the Russian Federation

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference73 articles.

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