Sensitivity of photoelectron energy loss spectroscopy to surface reconstruction of microcrystalline diamond films-Reference-Cited by-同舟云学术

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Sensitivity of photoelectron energy loss spectroscopy to surface reconstruction of microcrystalline diamond films

Published:2013-05 Issue: Volume:273 Page:607-612
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

David Denis G.F.,Pinault-Thaury Marie-Amandine,Ballutaud Dominique,Godet Christian

Funder

CNPq agency (Brazil)

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference44 articles.

1. Auger and X-ray Photoelectron Spectroscopy,1990

2. Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processes

3. Quantitative analysis of the inelastic background in surface electron spectroscopy

4. Quantitative model of electron energy loss in XPS

5. Electron transport in solids for quantitative surface analysis

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