Impact energy dependence of SF5+ ion beam damage of poly(methyl methacrylate) studied by time-of-flight secondary ion mass spectrometry-Reference-Cited by-同舟云学术

Impact energy dependence of SF5+ ion beam damage of poly(methyl methacrylate) studied by time-of-flight secondary ion mass spectrometry

Published:2004-06 Issue: Volume:231-232 Page:169-173
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Wagner M.S.,Gillen G.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference13 articles.

1. SIMS Depth Profiling of Polymer Surfaces

2. Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics

3. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

4. Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles

5. O. Brox, S. Hellweg, A. Benninghoven, in: A. Benninghoven, P. Bertrand, H.N. Migeon, H.W. Werner (Eds.), Proceedings of the 12th International Conference SIMS, Elsevier, Brussels, 1999, p. 777.

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