Comparison between optical techniques and confocal microscopy for defect detection on thin wires-Reference-Cited by-同舟云学术

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Comparison between optical techniques and confocal microscopy for defect detection on thin wires

Published:2004-11 Issue:1-4 Volume:238 Page:375-379
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Siegmann Philip,Sanchez-Brea Luis Miguel,Martinez-Anton Juan Carlos,Bernabeu Eusebio

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference8 articles.

1. E. Bernabeu et al. Surface structures on fine and ultra-fine wires, Editorial Complutense. ISBN: 84-7491-679-8. Madrid 2002.

2. Classification of surface structures on fine and ultra-fine wires;Bernabeu;Appl. Surf. Sci,2001

3. Measurements of surface defects on optical components;Gomez;Meas. Sci. Technol,1998

4. Measurement of surface defects on thin steel wires by atomic force microscopy;Sanchez-Brea;Appl. Surf. Sci,1999

5. Optical technique for the automatic detection and measurement of surface defects on thin metallic wires;Sanchez-Brea;Appl. Opt,2000

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optimal EWMA of linear combination of Poisson variables for multivariate statistical process control;International Journal of Production Research;2014-11-03

2. Multi-modal defect detection of residual oxide scale on a cold stainless steel strip;Machine Vision and Applications;2010-04-13

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