Measurement of surface defects on thin steel wires by atomic force microscopy-Reference-Cited by-同舟云学术

Measurement of surface defects on thin steel wires by atomic force microscopy

Published:1999-08 Issue:1-4 Volume:150 Page:125-130
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Sánchez-Brea L.M,Gómez-Pedrero J.A,Bernabeu E

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference9 articles.

1. Surface metrology;Whitehouse;Meas. Sci. Technol.,1997

2. Measurements of surface defects on optical components;Gomez;Meas. Sci. Technol.,1998

3. L.M. Sánchez-Brea, J.A. Gómez Pedrero, P. Siegmann, E. Bernabeu, Clasificación de defectos superficiales en hilos de acero (diámetro: 50-500 micras) por microscopı́a de fuerzas atómicas, 1er Congreso Español de Microscopı́a de Efecto Túnel, de Fuerzas Atómicas y de Técnicas Afines, Barcelona (Spain), 1998.

4. ARIS 3300 Personal Atomic Force Microscope users manual, Burleigh Instruments, New York, USA, 1994.

5. Diffusion of light from rough surfaces;Perez-Quintian;J. Mod. Opt.,1997

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Automatic Defect Classification on a Production Line;Intelligent Industrial Systems;2015-07-14

2. Multipose measurement of surface defects on rotary metal parts with a combined laser-and-camera sensor;Optical Engineering;2013-10-11

3. Development of a microscopic computer aided measurement system and its uncertainty;Measurement;2008-12

4. Novel optical technique for microscopic imaging of water stains;Applied Physics A;2005-02

5. Comparison between optical techniques and confocal microscopy for defect detection on thin wires;Applied Surface Science;2004-11