Auger electronic spectroscopy and electrical characterisation of InP(100) surfaces passivated by N2 plasma-Reference-Cited by-同舟云学术

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Auger electronic spectroscopy and electrical characterisation of InP(100) surfaces passivated by N2 plasma

Published:2004-07 Issue:1-4 Volume:234 Page:451-456
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Petit M,Robert-Goumet Ch,Bideux L,Gruzza B,Benamara Z,Bouiadjra N.Bachir,Matolin V

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference17 articles.

1. Absorption and Emission of Hexagonal InN. Evidence of Narrow Fundamental Band Gap

2. Do we know the fundamental energy gap of InN?

3. XPS studies on nitridation of InP(100) surface by ion beam bombardment

4. Nitridation of an InP(001) surface by nitrogen ion beams

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Simulation and electrical characterization of InN/InP diodes;Molecular Crystals and Liquid Crystals;2016-03-03

2. Activation and Decomposition of N2 on Heated Tungsten Filament Surfaces;The Journal of Physical Chemistry C;2011-03-21

3. Nitridation of InP(100) substrates studied by XPS spectroscopy and electrical analysis;Materials Science and Engineering: A;2006-11

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