ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization-Reference-Cited by-同舟云学术

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ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization

Published:2018-11 Issue: Volume:458 Page:805-809
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Choi Chang Min,Lee Sang Ju,Baek Ji Young,Kim Jeong Jin,Choi Myoung Choul

Funder

Korea Basic Science InstituteKorea Basic Science Institute

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference39 articles.

1. Materials processing by gas cluster ion beams;Yamada;Mater. Sci. Eng. R.,2001

2. Development and experimental application of a gold liquid metal ion source;Davies;Appl. Surf. Sci.,2003

3. Cluster primary ion bombardment of organic materials;Kollmer;Appl. Surf. Sci.,2004

4. The development of a range of C60 ion beam systems;Hill;Appl. Surf. Sci.,2006

5. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams;Ninomiya;Rapid Commun. Mass Spectrom.,2009

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