UV-irradiation induced modification of PDMS films investigated by XPS and spectroscopic ellipsometry-Reference-Cited by-同舟云学术

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UV-irradiation induced modification of PDMS films investigated by XPS and spectroscopic ellipsometry

Published:2003-06 Issue: Volume:532-535 Page:1067-1071
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Schnyder Bernhard,Lippert Thomas,Kötz Rüdiger,Wokaun Alexander,Graubner Vera-Maria,Nuyken Oskar

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference10 articles.

1. Room-Temperature Synthesis of a-SiO2 Thin Films by UV-Assisted Ozonolysis of a Polymer Precursor

2. UV–ozone induced growth of a SiOx surface layer on a cross-linked polysiloxane film: characterization and gas separation properties

3. Effect of Discharge Gases on Microwave Plasma Reactions of Imidazole on Poly(dimethylsiloxane) Surfaces: Quantitative ATR FT-IR Spectroscopic Analysis

4. Handbook of X-ray Photoelectron Spectroscopy;Moulder,1992

5. Nature of the use of adventitious carbon as a binding energy standard

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