In situ characterization of Mn and Fe silicide islands on silicon
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference18 articles.
1. Silicides for VLSI Applications;Murarka,1983
2. Semiconducting Silicides;Borisenko,2000
3. A clarification of the index of refraction of beta‐iron disilicide
4. An optical determination of the bandgap of the most silicon-rich manganese silicide phase
5. Electronic properties of semiconducting FeSi2films
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3. Highly Textured Mn15Si26 Film Obtained by High-Temperature Treatment;Journal of Electronic Materials;2012-09-29
4. STM study of growth of manganese silicide thin films on a Si(100)-21 surface;Acta Physica Sinica;2012
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