Element-selective mapping of magnetic moments in ultrathin magnetic films using a photoemission microscope-Reference-Cited by-同舟云学术

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Element-selective mapping of magnetic moments in ultrathin magnetic films using a photoemission microscope

Published:2001-06 Issue:3 Volume:480 Page:153-162
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Kuch W.,Gilles J.,Offi F.,Kang S.S.,Imada S.,Suga S.,Kirschner J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference35 articles.

1. Element-Specific Magnetic Microscopy with Circularly Polarized X-rays

2. W. Swiech, G.H. Fecher, Ch. Ziethen, O. Schmidt, G. Schönhense, K. Grzelakowski, C.M. Schneider, R. Frömter, H.P. Oepen, J. Kirschner, J. Electron Spectrosc. Relat. Phenom. 84 (1997) 171

3. W. Kuch, R. Frömter, J. Gilles, D. Hartmann, Ch. Ziethen, C.M. Schneider, G. Schönhense, W. Swiech, J. Kirschner, Surf. Rev. Lett. 5 (1998) 1241

4. Calculation of theM23magneto-optical absorption spectrum of ferromagnetic nickel

5. Absorption of circularly polarized x rays in iron

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4. Probing single magnetic nanoparticles by polarization-dependent soft x-ray absorption spectromicroscopy;Journal of Physics D: Applied Physics;2010-11-11

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