Sputtering of Cs-carrying diatomic cations from surfaces by keV Cs+ irradiation-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Sputtering of Cs-carrying diatomic cations from surfaces by keV Cs+ irradiation

Published:1998-03 Issue:1-3 Volume:174 Page:119-127
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Gnaser Hubert

Publisher

Elsevier BV

Subject

Spectroscopy

Reference38 articles.

1. Fundamentals in sputtering of atoms and molecules,1993

2. Secondary Ion Mass Spectrometry;Benninghoven,1987

3. Secondary neutral mass spectrometry (SNMS)-recent methodical progress and applications to fundamental studies in particle/surface interaction

4. Sputtering by Particle Bombardment;Sigmund,1981

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mass spectral analysis and quantification of Secondary Ion Mass Spectrometry data;International Journal of Mass Spectrometry;2015-07

2. Structural Conditions for Cesium Migration to Si(100) Surface Employing Electronic Structure Calculations;The Journal of Physical Chemistry C;2014-02-07

3. Mechanisms responsible for inducing and balancing the presence of Cs adatoms in dynamic Cs based SIMS;International Journal of Mass Spectrometry;2012-03

4. Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling;Applied Surface Science;2008-12

5. Accurate CsM⁺ SIMS Aluminum Dopant Profiling in SiC;Materials Science Forum;2006-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP