Author:
Higashi Yasuhiro,Maruo Tetsuya
Cited by
2 articles.
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1. Calculating time-of-flight spectra of post-ionized sputtered neutrals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06
2. Quantitative depth profiling by laser-ionization sputtered neutral mass spectrometry;Spectrochimica Acta Part B: Atomic Spectroscopy;1999-01