Resonant ionization of sputtered neutral atoms for trace analysis in high purity materials
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference12 articles.
1. Trace surface analysis with pico-coulomb ion fluences: Direct detection of multiphoton ionized iron atoms from iron-doped silicon targets
2. Sputter-initiated resonance ionization spectroscopy
3. Inst. Phys. Conf. Ser. no. 71,1984
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