Electron-induced effects in Ge-Se films studied by Kelvin probe force microscopy-Reference-Cited by-同舟云学术

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Electron-induced effects in Ge-Se films studied by Kelvin probe force microscopy

Published:2023-02 Issue: Volume:601 Page:121964
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Bilanych V.S.,Shylenko O.,Lytvyn P.M.,Bilanych V.V.,Rizak V.,Feher A.,Komanicky V.

Funder

Horizon 2020

Horizon 2020 Framework Programme

Agentúra na Podporu Výskumu a Vývoja

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. Phase-change materials for rewriteable data storage;Wuttig;Nat. Mater.,2007

2. Metamaterial electro-optic switch of nanoscale thickness;Sámson;Appl. Phys. Lett.,2010

3. An all-optical, non-volatile, bidirectional, phase-change meta-switch;Gholipour;Adv. Mater.,2013

4. Chalcogenide photonics;Eggleton;Nat. Photonics,2011

5. Integrated flexible chalcogenide glass photonic devices;Li;Nat. Photoics,2014

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution;Thin Solid Films;2024-01

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