Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution-Reference-Cited by-同舟云学术

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Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution

Published:2024-01 Issue: Volume:789 Page:140162
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Bilanych V.S.^ORCID,Shylenko O.,Vorobiov S.^ORCID,Soroka S.,Bilanych V.V.,Rizak V.^ORCID,Lytvyn P.M.^ORCID,Loya V. Yu^ORCID,Feher A.^ORCID,Komanicky V.

Funder

European Commission

Agentúra na Podporu Výskumu a Vývoja

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference45 articles.

1. Laser-induced phenomena in chalcogenide glassy films;Lyubin;Appl. Surf. Sci.,1996

2. Applications of chalcogenide glasses: an overview;Sagadevan;Int. J. ChemTech Res.,2014

3. Application of chalcogenide glasses in electronics and optoelectronics: a review;Mehta;J. Sci. Ind. Res.,2006

4. Chalcogenide glasses for sensor application: a review;Mishra,2018

5. Chalcogenide glass e-beam and photoresists for ultrathin grayscale patterning;Kovalskyy;J. Micro/Nanolithogr. MEMS, AND MOEMS,2009

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