Tensile-compression loading and pre-strain effects on the evolution of stacking fault tetrahedra, dislocation density, and free volume in crystal-amorphous thin film interface: A large-scale molecular dynamics study-Reference-Cited by-同舟云学术

Tensile-compression loading and pre-strain effects on the evolution of stacking fault tetrahedra, dislocation density, and free volume in crystal-amorphous thin film interface: A large-scale molecular dynamics study

Published:2019-06 Issue: Volume:514 Page:25-34
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Gupta Pradeep^ORCID,Yedla Natraj

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

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