Controlling the quality of nanocrystalline silicon made by hot-wire chemical vapor deposition by using a reverse H2 profiling technique-Reference-Cited by-同舟云学术

Controlling the quality of nanocrystalline silicon made by hot-wire chemical vapor deposition by using a reverse H2 profiling technique

Published:2008-05 Issue:19-25 Volume:354 Page:2087-2091
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Li H.,Franken R.H.,Stolk R.L.,van der Werf C.H.M.,Rath J.K.,Schropp R.E.I.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference17 articles.

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3. M. Yoshimi, T. Sasaki, T. Sawada, T. Suezaki, T. Meguro, T. Matsuda, K. Santo, K. Wadano, M. Ichikawa, A. Nakajima, K. Yamamoto, in: Proceedings of 3rd World Conference on Photovoltaic Energy Conversion, Osaka, May 2003, 5O.A6.01.

4. Present status of micro- and polycrystalline silicon solar cells made by hot-wire chemical vapor deposition

5. H. Li, Single and multijunction silicon based thin film solar cells on flexible substrates with absorber layers made by hot-wire CVD, PhD thesis, Utrecht University, 2007.

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