A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress

Published:1998-01 Issue:4 Volume:42 Page:351-381
ISSN:0304-3886
Container-title:Journal of Electrostatics
language:en
Short-container-title:Journal of Electrostatics

Author:

Russ Christian,Verhaege Koen,Bock Karlheinz,Roussel Philippe J.,Groeseneken Guido,Maes Herman E.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference43 articles.

1. Charged device model testing — trying to duplicate reality;Avery,1987

2. Influence of tester, test method and device type on CDM ESD testing;Verhaege,1994

3. Influence of tester parasitics on charged device model failure thresholds;Gieser,1994

4. Designing MOS inputs and outputs to avoid oxide failure in the charged device model;Maloney,1988

5. A study of CMOS integrated circuits charged device model ESD failure modes;Maene,1993

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of turn-on speeds of electrostatic discharge protection devices using transmission-line pulsing technique;2008 2nd IEEE International Nanoelectronics Conference;2008

2. MOSFET ESD Breakdown Modeling and Parameter Extraction in Advanced CMOS Technologies;IEEE Transactions on Electron Devices;2006-09

3. Extraction of eleven model parameters for consistent reproduction of lateral bipolar snapback high-current I-V characteristics in NMOS devices;IEEE Transactions on Electron Devices;2001-06

4. Characterization and optimization of a bipolar ESD-device by measurements and simulations;Microelectronics Reliability;1999-11

5. ESD protection methodology for deep-sub-micron CMOS;Microelectronics Reliability;1998-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3