Study of 50GeV proton ionization loss by semiconductor detector with smoothly tunable thickness-Reference-Cited by-同舟云学术

Study of 50GeV proton ionization loss by semiconductor detector with smoothly tunable thickness

Published:2017-01 Issue: Volume:391 Page:69-72
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Nazhmudinov R.M.,Kubankin A.S.,Shchagin A.V.,Shul'ga N.F.,Trofymenko S.V.,Britvich G.I.,Durum A.A.,Kostin M. Yu.,Maisheev V.A.,Chesnokov Yu.A.,Yanovich A.A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

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