Ge nanocrystals embedded in SiO2 in MOS based radiation sensors
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference28 articles.
1. Optical gain in silicon nanocrystals;Pavesi;Nature,2000
2. Size-dependent near-infrared photoluminescence from Ge nanocrystals embedded in SiO2 matrices;Takeoka;Phys. Rev. B,1998
3. Formation of Ge nanocrystals embedded in a SiO2 matrix: transmission electron microscopy X-ray absorption and optical studies;Kolobov;Phys. Rev. B,2003
4. Preparation of SiO2 films with embedded Si nanocrystals by reactive rf magnetron sputtering;Seifarth;Thin Solid Films,1998
5. Simple quantum confinement theory for exciton in indirect gap nanostructures;Oanh;Intern. J. Mod. Phys. B,2000
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Influence of fast neutron irradiation on the phase composition and optical properties of homogeneous SiOx and composite Si–SiOx thin films;Journal of Materials Science;2020-10-26
2. Selective photosensitivity of metal–oxide–semiconductor structures with SiOx layer annealed at high temperature;Journal of Materials Science: Materials in Electronics;2020-08-30
3. Influence of frequency and gamma irradiation on the electrical characteristics of Er2O3, Gd2O3, Yb2O3, and HfO2 MOS-based devices;Journal of Materials Science;2020-03-28
4. Orthorhombic HfO2 with embedded Ge nanoparticles in nonvolatile memories used for the detection of ionizing radiation;Nanotechnology;2019-08-14
5. The effect of oxide layer thickness on the quantification of 1.5 MeV γ –radiation induced interface traps in the Ag/SiO 2 /Si MOS devices;Materials Science in Semiconductor Processing;2017-09
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3