Charging effect during ion beam analysis: Comparison between aluminium and glass substrates-Reference-Cited by-同舟云学术

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Charging effect during ion beam analysis: Comparison between aluminium and glass substrates

Published:2005-10 Issue:1-2 Volume:240 Page:381-385
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Trouslard Ph.,Pellegrino S.,Beck L.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. Introduction to Radioanalytical Physics;Deconninck,1978

2. Forward Recoil Spectrometry;Tirira,1996

3. Rutherford backscattering spectroscopy of insulating materials

4. 25 years of IBA teaching experience at the National Institute for Nuclear Science and Technology, France

5. Experimental neutral charge fractions in proton beams emerging from solids

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Direct etching of $Si O_{2}$ and ${Al}_{2} O_{3}$ by $900 - keV$ gold ions;Journal of Micro/Nanolithography, MEMS, and MOEMS;2009-01-01

2. Differential cross-sections for nuclear reactions on Al and Si induced by deuterons at low energy (1–2MeV);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-05

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