A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films-Reference-Cited by-同舟云学术

A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films

Published:2005-01 Issue:3 Volume:227 Page:397-419
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Barradas N.P.,Added N.,Arnoldbik W.M.,Bogdanović-Radović I.,Bohne W.,Cardoso S.,Danner C.,Dytlewski N.,Freitas P.P.,Jakšić M.,Jeynes C.,Krug C.,Lennard W.N.,Lindner S.,Linsmeier Ch.,Medunić Z.,Pelicon P.,Pezzi R.P.,Radtke C.,Röhrich J.,Sajavaara T.,Salgado T.D.M.,Stedile F.C.,Tabacniks M.H.,Vickridge I.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

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