The sensitivity of 100nm RADFETs with zero gate bias up to dose of 230Gy(Si)
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference35 articles.
1. X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides;Houssa;Microelec. Eng.,1999
2. The electron irradiation effects on silicon gate dioxide used for power MOS devices;Badila;Microelectron. Reliab.,2001
3. Oxide and interface charges in ultrathin SiO2 thermally grown on RF plasma-hydrogenated silicon;Alexandrova;Vacuum,2004
4. Investigation of p-type MOS structure irradiated with 23MeV electrons;Kaschieva;Plasma Processes Polym.,2006
5. Influence of gamma and x radiation on gas-filled surge arrester characteristics;Lončar;IEEE Trans. Plasma Sci.,2006
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