Transportation of carriers in silicon implanted SiO2 films during ionizing radiation
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference11 articles.
1. C. Claeys, E. Simoen, Radiation Effects in Advanced Semiconductor Materials and Devices, Springer-Verlag, Heidelberg, 2002, p. 6.
2. Radiation effects and hardening of MOS technology: devices and circuits
3. Fabrication of Total-Dose-Radiation-Hardened (TDRH) SOI wafer with embedded silicon nanoclusters
4. A study on the total-dose response for modified silicon-on-insulator materials with the pseudo-MOS method
5. Hole and electron trapping in ion implanted thermal oxides and SIMOX
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