Research on temperature measurement by X-ray transmission intensity

Author:

Chen Shuyue,Cheng Rong

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Review of temperature measurement;Childs;Rev. Sci. Instrum.,2000

2. L. BlackBurn David, Temperature measurements of semiconductor devices – A review, Annual IEEE Semiconductor Thermal Measurement and Management Symposium, vol. 20, 2004, pp. 70–80.

3. X-ray absorption measurements to determine the gas temperature in HID lamps;Zhu;Inst. Phys. Conf. Ser.,2004

4. Spatially resolved spectra from a new X-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles;Bitter;J. Rev. Sci. Instrum.,2004

5. T. Doppner, O.L. Landen, H.J. Lee, et al., Temperature measurement through detailed balance in X-ray Thomson scattering, Soft X-Ray Lasers and Applications VIII.7451(2009).

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