Spatially resolved spectra from a new x-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles (invited)-Reference-Cited by-同舟云学术

Spatially resolved spectra from a new x-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles (invited)

Published:2004-10 Issue:10 Volume:75 Page:3660-3665
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:

Author:

Bitter M.¹,Hill K. W.¹,Stratton B.¹,Roquemore A. L.¹,Mastrovito D.¹,Lee S. G.²,Bak J. G.²,Moon M. K.³,Nam U. W.⁴,Smith G.⁵,Rice J. E.⁶,Beiersdorfer P.⁷,Fraenkel B. S.⁸

Affiliation:

1. Plasma Physics Laboratory, Princeton University, Princeton, New Jersey 08543

2. Korea Basic Science Institute, Yusung, Taejeon 305-333, Korea

3. Korea Atomic Energy Research Institute, Yusung, Taejeon

4. Korea Astronomy Observatory, Yusung, Taejeon 305-348, Korea

5. Brookhaven National Laboratory, Upton, New York 11973

6. Plasma Science and Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

7. Lawrence Livermore National Laboratory, Livermore, California 94550

8. Hebrew University, Jerusalem, Israel

Publisher

AIP Publishing

Subject

Instrumentation

Reference21 articles.

1. Imaging x-ray crystal spectrometers for the National Spherical Torus Experiment

2. US Patent No. 6,259,763 B1, 10 July (2001).

3. S.G. Lee et al., Poster C06 at this conference.

4. R. Barnsley et al., Poster C23 at this conference.

5. Vertical high‐resolution Bragg x‐ray spectrometer for the tokamak fusion test reactor

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