The proton irradiation facility for Single-Event effect testing in CIAE*

Author:

Zhang Yan-Wen,Guo Gang,Liu Jian-Cheng,Han Jin-Hua,Qin Ying-Can,Yin Qian,Xiao Shu-Yan,Yang Xin-Yu

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference25 articles.

1. Proc;Mcmahan,2008

2. Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

3. Schwank J R, Shaneyfelt M R, Ferlet-Cavrois V, Dodd P E, Blackmore E, Pellish J, Rodbell K P, Heidel D F, Marshall P W, Label K, Gouker P M, Tam N, Wong RN, Wen S J, Reed R A, Dalton S M and Swanson S E, 12th European Conference on Radiation and Its Effects on Components and Systems 2011 p788.

4. Proton on Metal Fission Environments in an IC Package: An RHA Evaluation Method

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