Depth selective PIXE for surface analysis with low energy heavy ions-Reference-Cited by-同舟云学术

Depth selective PIXE for surface analysis with low energy heavy ions

Published:2012-05 Issue: Volume:279 Page:194-197
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Pawłowski Bogdan,Moneta Marek E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

5. Particle Induced X-ray Emission spectrometry (PIXE);Johansson,1995

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