PIXE from thin films and amorphous alloys induced by medium energy heavy ions

Author:

Antoszewska Małgorzata,Brzozowski Romuald,Balcerski Józef,Dolecki Kazimierz,Fra¸tczak Ewelina,Pawłowski Bogdan,Moneta Marek

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. NIXE: Neutron Depth Profiling coupled with Particle Induced X-ray Emission;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-02

2. Transformation of amorphous alloy surface and thin film under impact of slow heavy ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-10

3. Iron Containing Supplement Biofer Investigated by X-ray Fluorescence, Energy Dispersive X-Ray Spectroscopy and Mössbauer Spectroscopy;Acta Physica Polonica A;2015-11

4. Modification of thin films induced by slow heavy ions analysed with PIXE and SRIM;The European Physical Journal D;2015-03

5. Sputtering and Implantation of VV-6025X Surface with Slow Heavy Ions Monitored with PIXE;Acta Physica Polonica A;2014-07

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