Author:
Mayer M.,Fischer R.,Lindig S.,von Toussaint U.,Stark R.W.,Dose V.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Computer simulation of ion beam analysis: Possibilities and limitations;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-12
2. Incorporation of transparent conducting oxide characteristics and oxygen analysis in vacuum annealed indium oxide films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-11
3. Bayesian inference in physics;Reviews of Modern Physics;2011-09-19
4. Layer morphology analysis of sputter-eroded silicon gratings using Rutherford backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-08
5. Incorporation of oxygen during oxidative annealing of thermally evaporated In films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-11