Upgrades of a time-of-flight elastic recoil detection analysis measurement system for thin film analysis
Author:
Funder
JSPS
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference18 articles.
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1. High-resolution Li depth profiling in a thin-film all-solid-state battery using TOF-ERDA;Applied Physics Letters;2024-07-15
2. Commissioning of the ERDA-TOF beamline at the ion beam laboratory in Madrid;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-06
3. Sensitive multi-element profiling with high depth resolution enabled by time-of-flight recoil detection in transmission using pulsed keV ion beams;Vacuum;2022-10
4. Ion Accelerator Facility of the Wakasa Wan Energy Research Center for the Study of Irradiation Effects on Space Electronics;Quantum Beam Science;2021-05-13
5. Time-Of-Flight ERDA for Depth Profiling of Light Elements;Quantum Beam Science;2020-11-18
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