Mechanisms of damage formation in semiconductors-Reference-Cited by-同舟云学术

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Mechanisms of damage formation in semiconductors

Published:2009-08 Issue:16 Volume:267 Page:2680-2689
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Wendler E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference66 articles.

1. High Energy Ion Beam Analysis of Solids,1988

2. Hand Book of Modern Ion Beam Analysis,1995

3. Modified master equation approach of axial dechanneling in perfect compound crystals

4. J.F. Ziegler, J.P. Biersack, U. Littmark, The Stopping and Ranges of Ions in Solids, Pergamon, New York, 2003. .

5. Effect of high electronic energy deposition in semiconductors

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