Depth characterization of nm-layers by low energy ion scattering-Reference-Cited by-同舟云学术

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Depth characterization of nm-layers by low energy ion scattering

Published:2004-06 Issue: Volume:219-220 Page:578-583
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Draxler M.,Markin S.N.,Beikler R.,Taglauer E.,Kastner F.,Bergsmann M.,Bauer P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. An overview on metal/PET adhesion

2. Photoemission study of the copper/poly(ethylene terephthalate) interface

3. Comparative study of metal adsorption on the metal and the oxide surfaces

4. Growth of copper and palladium on α-Al2O3(0001)

5. Surface Analysis – The Principal Techniques;Taglauer,1997

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A practical guide to interpreting low energy ion scattering (LEIS) spectra;Applied Surface Science;2023-11

2. Low-Energy Ion Scattering;Characterization of Materials;2012-10-12

3. Effect of energy loss in the simulation of slow ion scattering by a solid surface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-03

4. In situ analysis of Ga-ultrathin films by TOF-LEIS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-08

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